Instrumentation Aspects of mm-Wave On-Wafer Measurements

A successful mm-wave on-wafer measurement campaign involves the positive interaction of many aspects including the probes, the calibration devices and method, the probing and DUT environment and the instrumentation. This talk focuses on the network analyzer hardware in a mm-wave setup and how it interacts with the probing problem as a deeper understanding of the important mechanisms may help one to configure the setup to optimize sensitivities and uncertainties. Specifically, mm-wave VNA architectures are presented and topics such as power control, receiver linearity and noise behavior, and port impedance and coupling characteristics are covered.