Millimeter-Wave On-Wafer Large Signal Characterization System for Harmonic Source/Load Pull and Waveform Measurements

This paper describes a large-signal single-sweep characterization system based on vector network analyzer receivers for on-wafer harmonic load/source pull measurements up to 110 GHz using passive tuners, and waveform measurements up to 100 GHz using an oscilloscope as a phase meter. The calibration and measurement procedures are described and validated with thru structures and on GaAs HEMTs at Ka-band demonstrating the capability to offer an important insight for both technology developers and designers of millimetre-wave transistors and amplifiers.