How to Succeed in RF and mm-Wave On-Wafer Testing at Cryogenic Temperatures?

Traditional RF and mm-wave on-wafer probing within the temperature range of -60 to 125 °C often presents a formidable challenge for many customers. However, this comes across as almost trivial compared to probing in the vacuum of the cryogenic environment, where the probe thermal loading can fundamentally compromise measurement integrity. Likewise, the presence of gas within a coaxial cable is a factor often overlooked by most customers. The talk will address the considerations and pitfalls of cryogenic RF/mm-wave on-wafer probing, offering insights into strategies for mitigating these issues and ensuring accurate measurements.