EM-Driven Tolerance Optimization of Compact Microwave Components Using Response Feature Surrogates

Improving microwave component immunity to parameter deviations is of high importance, especially in the case of stringent performance specifications. This paper proposes a computationally efficient algorithm for robustness enhancement of compact microwave circuits. The objective is to increase the acceptable levels of geometry parameter deviations under which the prescribed performance specifications are still fulfilled. Our approach incorporates feature-based surrogate models utilized for low-cost prediction of the fabrication yield, as well as the trust-region framework for adaptive control of design relocation and ensuring convergence of the optimization process. The efficacy of our technique is demonstrated using a broadband microstrip filter.