Electromagnetic Analysis of Integrated On-Chip Sensing Loop for Side-Channel and Fault-Injection Attack Detection

Securing crypto-cores is getting increasingly difficult with the advent of EM side-channel analysis (EMSCA) and fault injection attacks (FIA). This article presents an Ansys HFSS based simulation framework for EM analysis of an integrated on-chip sensor for detecting EMSCA \& FIA and validates the efficacy of an on-chip higher metal layer loop-based zero area-overhead sensor using a custom-built 65nm CMOS IC. A simple technique for incoming H-probe detection is also presented by measuring the absolute average of the induced voltage for every encryption.