Electro-Thermal Modeling of AM-SLM Based Cavity Resonators

This paper investigates resonant frequency and quality (Q)-factor for X-band cavity resonators fabricated with additive manufacturing selective laser melting (AM-SLM) technology, contrasting versus conventional milled resonators under varied thermal stress. Both resonant frequency and Q-factor decrease as temperature rises, attributed to the coefficient of thermal expansion and the temperature-dependent nature of electrical conductivity, respectively. Utilizing the Groiss and one-ball Huray surface roughness models, full-wave simulations accurately model the Q-factor variations for AM-SLM and milling technologies. This study underscores that enhancing the electro-thermal performance of AM-SLM cavity resonators is achievable by minimizing surface roughness.