Field, Device and Circuit Tech.

Image
TS green color

-

Zhizhang David Chen
Dalhousie University
Vladimir Okhmatovski
Univ. of Manitoba
Location
152AB
Abstract

Computational methods for the simulation of electromagnetic structures are indispensable for exploring new technologies and applications. This session presents significant advances that result in accelerated solvers of electrically large problems and robust multiphysics simulators, exploiting mathematical advances and machine learning.

Abstract
We1I-1: Parallel Fast Direct Error-Controlled Scattering Solutions via an H-Matrix-Accelerated Locally Corrected Nyström Method for the Combined Field Integral Equation
Omid Babazadeh, Jin Hu, Emrah Sever, Ian Jeffrey, Constantine Sideris, Vladimir Okhmatovski
Univ. of Manitoba, Univ. of Southern California, Aselsan, Univ. of Manitoba, Univ. of Southern California, Univ. of Manitoba
(08:00 - 08:20)
Abstract
We1I-2: Coupled Electromagnetic-Thermal Analysis for Temperature-Dependent Materials with Physics-Informed Neural Networks
Shutong Qi, Costas D. Sarris
Univ. of Toronto, Univ. of Toronto
(08:20 - 08:40)
Abstract
We1I-3: Numerical Demonstration of THz Traveling Wave Amplifications in 2DElectron Gas (2DEG) under Scattering-Free and Low-Charge DensityRegime
Shubhendu Bhardwaj, Md Faiyaz Bin Hassan
University of Nebraska-Lincoln, University of Nebraska-Lincoln
(08:40 - 09:00)
Abstract
We1I-4: A Novel Causal Method to Blend the DC and AC Solution Over the Entire Frequency Band
Peng Liu, Werner Thiel, Xin Xu, Kevin Zhu, Eric Bracken
Ansys, Ansys, Ansys, Ansys, Ansys
(09:00 - 09:20)
Abstract
We1I-5: Order Reduction Using Laguerre-FDTD with Embedded Neural Network
Yifan Wang, Yiliang Guo, Rahul Kumar, Madhavan Swaminathan
Georgia Tech, Georgia Tech, Pennsylvania State Univ., Georgia Tech
(09:20 - 09:40)

-

Costas D. Sarris
Univ. of Toronto
Werner Thiel
ANSYS
Location
152AB
Abstract

This session will feature the design of novel microwave/mm-wave waveguide-based components and metasurfaces and the advanced characterization of thermal and twisting effects in dielectric waveguides for mm-wave applications.

Abstract
We2I-1: Electronic Control of Structural Asymmetry for Tunable Nonreciprocal Phase Shift in CRLH Transmission Lines
Hidefumi Yasuda, Tetsuya Ueda
Kyoto Institute of Technology, Kyoto Institute of Technology
(10:10 - 10:30)
Abstract
We2I-2: A 3D-Printed Millimeter-Wave Free-Form Metasurface Based on Automatic Differentiable Inverse Design
Yi Huang, Hong Tang, Huan Zhao, Yunxi Dong, Bowen Zheng, Hualiang Zhang
UMass Lowell, UMass Lowell, UMass Lowell, UMass Lowell, UMass Lowell, UMass Lowell
(10:30 - 10:50)
Abstract
We2I-3: A Modified Gradient Model to Determine Surface Impedance from Measured Roughness Profiles with Printed Circuit Board Emphasis
Felix Sepaintner, Andreas Scharl, Johannes Jakob, Franz Roehrl, Werner Bogner, Stefan Zorn
Technische Hochschule Deggendorf, Rohde & Schwarz, Technische Hochschule Deggendorf, Rohde & Schwarz, Technische Hochschule Deggendorf, Rohde & Schwarz
(10:50 - 11:10)
Abstract
We2I-4: Plasma Based Absorptive and Adaptive High-Power Waveguide Protector
Krushna Kanth V., Md. Tanvir Ahmed, Abbas Semnani
Univ. of Toledo, Univ. of Toledo, Univ. of Toledo
(11:10 - 11:30)
Abstract
We2I-5: Electromagnetic Stability Characterization of Millimeter-Wave Dielectric Fibers at Extremely High-Temperatures: Enabling Harsh Environment Communication and Sensing
Abhishek Sharma, Yanghyo Rod Kim
Stevens Institute of Technology, Stevens Institute of Technology
(11:30 - 11:40)
Abstract
We2I-6: Twisting Effects on X-Shaped Millimeter-Wave Plastic Waveguides
Samir Lagoug, Anthony Ghiotto, Éric Kerhervé
IMS (UMR 5218), IMS (UMR 5218), IMS (UMR 5218)
(11:40 - 11:50)

-

Da Huang
MathWorks
David R. Jackson
Univ. of Houston
Location
152AB
Abstract

This session includes advances in numerical and analytic techniques for modeling of diverse microwave components and systems, as well as hybrid field/circuit and multiphysics simulations. Advanced numerical methods that enable novel measurement techniques are also given, including near-to-far field transformations for predicting antenna patterns by sampling in the near-field over an arbitrary-shaped surface surrounding the antenna. Simulation methodologies for signal integrity prediction in high-speed links are also included.

Abstract
We3I-1: KEYNOTE: Spectrum of Insights with Advanced Engineering Simulation
Larry Williams
Ansys
(13:30 - 13:50)
Abstract
We3I-2: Analytic Differential Admittance Operator Solution of a Dielectric Sphere Under Radial Dipole Illumination
M. Huynen, D. De Zutter, D. Vande Ginste, Vladimir Okhmatovski
IDLab, IDLab, IDLab, Univ. of Manitoba
(13:50 - 14:10)
Abstract
We3I-3: A Rigorous 3D Near to Far Field Transformation When Only an Electric or Magnetic Field is Available
Jose M. Tamayo, Andrew Mathis, Werner Thiel
Ansys, Ansys, Ansys
(14:10 - 14:30)
Abstract
We3I-4: Integrated Distributed Equivalent Circuit Model of PCIe 5.0 Connector with AIC and Baseboard Loading Resonances for Fast SI Diagnosis
Yulin He, Kewei Song, Milton Feng
University of Illinois Urbana-Champaign, University of Illinois Urbana-Champaign, University of Illinois Urbana-Champaign
(14:30 - 14:50)
Abstract
We3I-5: Optically-Transparent FSS for Outdoor-to-Indoor Transmission Improvement Featuring Electromagnetic-Thermal Co-Analysis
Youngno Youn, Cheonga Lee, Daehyeon Kim, Donggeun An, Ahmed Abdelmottaleb Omar, Wonbin Hong
POSTECH, POSTECH, POSTECH, POSTECH, KFUPM, POSTECH
(14:50 - 15:10)

-

José E. Rayas-Sánchez
ITESO
Marco Pirola
Politecnico di Torino
Location
145AB
Abstract

This session features a variety of contributions on the topics of artificial neural networks, innovative knowledge transfer approaches, non-linear behavioral modeling and design of power amplifiers and oscillators. This session offers insights into the latest trends in simulation and modeling, bridging theoretical concepts with practical applications.

Abstract
Th1B-1: A Novel Transfer Learning Approach for Efficient RF Device Behavior Model Parameter Extraction
Ruijin Wang, Jiangtao Su, Weiyu Xie, Mengmeng Xu, Kuiwen Xu, Lingling Sun
HangZhou DianZi University, HangZhou DianZi University, HangZhou DianZi University, HangZhou DianZi University, HangZhou DianZi University, HangZhou DianZi University
(08:00 - 08:20)
Abstract
Th1B-2: Transfer Learning Framework for 3D Electromagnetic Structures
Oluwaseyi Akinwande, Sri Laxmi Ganna, Rahul Kumar, Madhavan Swaminathan
Georgia Tech, Pennsylvania State Univ., Pennsylvania State Univ., Georgia Tech
(08:20 - 08:40)
Abstract
Th1B-3: Analysis of Two Wirelessly Locked Oscillators Based on Realistic Nonlinear Oscillator Models
Camilo Moncada Guayazan, Franco Ramirez, Almudena Suarez
Universidad de Cantabria, Universidad de Cantabria, Universidad de Cantabria
(08:40 - 09:00)
Abstract
Th1B-4: Automated mmWave Power Amplifier Design Flow and a 28-GHz Design Example in 45-nm CMOS SOI
Yaolong Hu, Xiaohan Zhang, Qiang Zhou, Fan Cai, Cindy Cui, Taiyun Chi
Rice Univ., Rice Univ., Rice Univ., Keysight Technologies, Keysight Technologies, Rice Univ.
(09:00 - 09:20)
Abstract
Th1B-5: Analysis and Modeling of Super-Regenerative Oscillators with FMCW Signals
Sergio Sancho, Mabel Ponton, Almudena Suarez
Universidad de Cantabria, Universidad de Cantabria, Universidad de Cantabria
(09:20 - 09:40)
Marcus Da Silva
National Instruments
Marco Spirito
Technische Universiteit Delft
Location
150AB
Abstract

This joint IMS/ARFTG session will take you through advances in the field of OTA characterization. The papers range from quasi-optical techniques to mitigation of alignment errors, built-in test for EIRP and electromagnetic jet imaging.

Abstract
Th1G-1: KEYNOTE: Electro-Optic Mapping Techniques for Characterization of Microwave Circuits, Devices and Antenna Systems
Kazem Sabet
EMAG Technologies
(08:00 - 08:20)
Abstract
Th1G-2: A Near-Field Quasi-Optical Measurement Technique for Probe-Fed High-Gain Backside-Radiating Antennas
Nick van Rooijen, M. Spirito, A. Bechrakis Triantafyllos, N. Llombart, M. Alonso-delPino
Technische Universiteit Delft, Technische Universiteit Delft, Technische Universiteit Delft, Technische Universiteit Delft, Technische Universiteit Delft
(08:20 - 08:40)
Abstract
Th1G-3: Load-Impedance-Aware EIRP Calibration in FR2 Phased Arrays
Viduneth Ariyarathna, Wan Jong Kim, Pranav Dayal, Venumadhav Bhagavatula, Ivan Lu, Chinh Doan
Samsung Semiconductor, Inc., Samsung Semiconductor, Inc., Samsung Semiconductor, Inc., Samsung Semiconductor, Inc., Samsung Semiconductor, Inc., Samsung Semiconductor, Inc.
(08:40 - 09:00)
Abstract
Th1G-4: Toward Free Space Local Characterization Method in Microwave
Mathis Granger, Ali Ghaddar, Bernard Bayard, Bruno Sauviac
Laboratoire Hubert Curien (UMR 5516), Laboratoire Hubert Curien (UMR 5516), Laboratoire Hubert Curien (UMR 5516), Laboratoire Hubert Curien (UMR 5516)
(09:00 - 09:20)
Abstract
Th1G-5: Simplifying Polarization Alignment in Modulated Antenna Measurements
Gerardo Orozco, Thomas Deckert, Nan Yang
National Instruments, National Instruments, National Instruments
(09:20 - 09:30)

-

Shuhei Amakawa
Hiroshima Univ.
Ricardo Figueiredo
Universidade de Aveiro
Location
150AB
Abstract

This joint IMS/ARFTG session presents a number of exciting developments in mm-wave measurement, including new observations in on-wafer calibrations and improvements in mm-wave noise characterization. The session concludes in a novel wideband measurement approach for higher-rate modulated analysis.

Abstract
Th2G-1: KEYNOTE: Current Limitations and Novel Approaches to THz On-Wafer Electronic Characterization
Jerome Cheron
NIST
(10:10 - 10:30)
Abstract
Th2G-2: On-Wafer Calibration Comparisons of Multiline TRL with Platinum and Gold Conductors
Tomasz Karpisz, Jacob T. Pawlik, Johannes Hoffmann, Sarah R. Evans, Christian J. Long, Nathan D. Orloff, James C. Booth, Angela C. Stelson
NIST, NIST, METAS, NIST, NIST, NIST, NIST, NIST
(10:30 - 10:50)
Abstract
Th2G-3: Enhanced Accuracy in On-Wafer Noise Figure Measurements at Sub-Terahertz Frequencies
Nizar Messaoudi, Shengjie Gao, Muhammad Waleed Mansha, Yves Baeyens, Mustafa Sayginer, Slim Boumaiza, Bryan Hosein, Shahriar Shahramian
Keysight Technologies, Focus Microwaves, Nokia Bell Labs, Nokia Bell Labs, Nokia Bell Labs, Univ. of Waterloo, Focus Microwaves, Nokia Bell Labs
(10:50 - 11:10)
Abstract
Th2G-4: Measurement of Residual Phase Noise of Amplifiers at 80GHz Using Interferometric Measurement Technique
Wolfgang Wendler, Alexander Roth
Rohde & Schwarz, Rohde & Schwarz
(11:10 - 11:30)
Abstract
Th2G-5: Millimeter-wave Device Characterization Under Wideband Modulated Signals using Vector Network Analyzer Frequency Extenders
Ahmed Ben Ayed, Patrick Mitran, Slim Boumaiza
Univ. of Waterloo, Univ. of Waterloo, Univ. of Waterloo
(11:30 - 11:50)